Boundary Scan Testing
Boundary scan is a method for testing interconnects on printed circuit boards or sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized as IEEE 1149.1 This standard has been adopted by electronic device companies all over the world.
Our boundary scan solution also offers excellent fault diagnosis and fast programming for the production line. Using this test and programming method, your test stand will be significantly cheaper because no complex system of test points is needed. Due to the flexible tool interfaces, our solution easily integrates with manufacturing systems. Test development is simplified when compared with traditional manufacturing test solutions, lowering pre-production test development cost significantly.
Interconnection testing as well as pin-state change monitoring and voltage measurements through boundary scan can also be used in conjunction with functional (hardware) system testing. Often the boundary scan part is integrated into a larger test stand.
J-Testr is a highly compact ‘all-in-one’ modular functional test system controllable via JTAG and Ethernet. The small physical footprint and stowage features maximise the use of production space and also makes the J-Testr portable and easy to store.
XJAnalyser is a powerful tool for real time circuit visualisation and debugging. It provides a graphical view of JTAG chains, giving you complete control, on a pin-by-pin basis, of both pin state (either driven as an output or tristated as an input) and pin value (either high or low when driven), and it has the facility to run SVF and STAPL / JAM files.
XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for manufacturers. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
XJRunner is the specialised run-time environment for executing pre-compiled XJDeveloper projects. With a range of special features it is particularly aimed at board manufacturers and in-field support.
In one package, you have interconnect testing, in-system programming, non-JTAG device testing, serial number handling and configurable log files for your audit trail.
The XJTAG DFT Assistant is a free software extension developed by XJTAG® for the Altium Designer unified development environment. Comprising much of the setup stages found in XJDeveloper, along with additional and unique functionality, it allows engineers to conduct Design For Test (DFT) checks of a design during the schematic capture stage.
XJTAG Expert is the world’s first portable Boundary Scan test solution that comes with digital oscilloscope, waveform and function generator, spectrum analyser and serial protocols analyser. Its USB 2.0 to JTAG adapter provides a high speed interface to the JTAG chain while the advanced features make it easier to test, debug and repair a wide range of circuit boards. The portable design means the XJTAG Expert ADF-2 can easily be taken to the Unit Under Test (UUT).
Choose the right boundary scan testing tools
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Logic Technology – more than 25 years of experience in embedded testing
As part of our Boards & Solutions department, Logic Technology offers specialist tools and services for testing and programming electronics. For board designers we offer integrated test development solutions for fast prototype board bring-up and debug. Using boundary scan technology, you can start running interconnection tests within minutes of applying power to your board, even before it is configured through firmware. Expand test coverage by using our built-in library of functional tests for non-boundary scan enabled devices and make use of our advanced interconnection test to find open-circuits, missing pull-up/down resistors, or shorts ‘hidden’ behind resistors, as well as testing connections through logic devices.